dc.creator | Nikolić, Pantelija M. | |
dc.creator | Luković Golić, Danijela | |
dc.creator | Savić, Slavica M. | |
dc.creator | Radović, DV | |
dc.creator | Radulović, K | |
dc.creator | Vujatović, Stevan S | |
dc.creator | Lukic, L | |
dc.creator | Djuric, S | |
dc.creator | Nikolić, Maria Vesna | |
dc.creator | Bojicic, Aleksandar | |
dc.date.accessioned | 2022-04-05T14:06:33Z | |
dc.date.available | 2022-04-05T14:06:33Z | |
dc.date.issued | 2005 | |
dc.identifier.issn | 1155-4339 | |
dc.identifier.uri | http://rimsi.imsi.bg.ac.rs/handle/123456789/127 | |
dc.description.abstract | Thermal and electron transport properties of single crystal NiO were determined using the photoacoustic technique. NiO single crystals were prepared using the Verneuil method and were easily cleaved parallel to the (100) plane. All samples were of the p type. Atomic force microscopy images of cleaved NiO samples were made enabling a view of steps along the (001) direction and terraces, which were between 20 nm and 100 nm thick. | en |
dc.publisher | E D P Sciences, Les Ulis Cedex A | |
dc.rights | restrictedAccess | |
dc.source | Journal De Physique IV | |
dc.subject | NiO | |
dc.subject | photoacoustic spectroscopy | |
dc.subject | transport properties | |
dc.title | Photoacoustic determination of thermal and electron transport properties of single crystal NiO | en |
dc.type | article | |
dc.rights.license | ARR | |
dc.citation.epage | 442 | |
dc.citation.other | 125: 439-442 | |
dc.citation.rank | M23 | |
dc.citation.spage | 439 | |
dc.citation.volume | 125 | |
dc.identifier.doi | 10.1051/jp4:20051250103 | |
dc.identifier.scopus | 2-s2.0-33645059500 | |
dc.identifier.wos | 000230014700104 | |
dc.type.version | publishedVersion | |