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Photoacoustic determination of thermal and electron transport properties of single crystal NiO

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Authors
Nikolić, Pantelija M.
Luković Golić, Danijela
Savić, Slavica M.
Radović, DV
Radulović, K
Vujatović, Stevan S
Lukic, L
Djuric, S
Nikolić, Maria Vesna
Bojicic, Aleksandar
Article (Published version)
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Abstract
Thermal and electron transport properties of single crystal NiO were determined using the photoacoustic technique. NiO single crystals were prepared using the Verneuil method and were easily cleaved parallel to the (100) plane. All samples were of the p type. Atomic force microscopy images of cleaved NiO samples were made enabling a view of steps along the (001) direction and terraces, which were between 20 nm and 100 nm thick.
Keywords:
NiO / photoacoustic spectroscopy / transport properties
Source:
Journal De Physique IV, 2005, 125, 439-442
Publisher:
  • E D P Sciences, Les Ulis Cedex A

DOI: 10.1051/jp4:20051250103

ISSN: 1155-4339

WoS: 000230014700104

Scopus: 2-s2.0-33645059500
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1
1
URI
http://rimsi.imsi.bg.ac.rs/handle/123456789/127
Collections
  • Radovi istraživača / Researchers’ publications
Institution/Community
Institut za multidisciplinarna istraživanja
TY  - JOUR
AU  - Nikolić, Pantelija M.
AU  - Luković Golić, Danijela
AU  - Savić, Slavica M.
AU  - Radović, DV
AU  - Radulović, K
AU  - Vujatović, Stevan S
AU  - Lukic, L
AU  - Djuric, S
AU  - Nikolić, Maria Vesna
AU  - Bojicic, Aleksandar
PY  - 2005
UR  - http://rimsi.imsi.bg.ac.rs/handle/123456789/127
AB  - Thermal and electron transport properties of single crystal NiO were determined using the photoacoustic technique. NiO single crystals were prepared using the Verneuil method and were easily cleaved parallel to the (100) plane. All samples were of the p type. Atomic force microscopy images of cleaved NiO samples were made enabling a view of steps along the (001) direction and terraces, which were between 20 nm and 100 nm thick.
PB  - E D P Sciences, Les Ulis Cedex A
T2  - Journal De Physique IV
T1  - Photoacoustic determination of thermal and electron transport properties of single crystal NiO
EP  - 442
SP  - 439
VL  - 125
DO  - 10.1051/jp4:20051250103
ER  - 
@article{
author = "Nikolić, Pantelija M. and Luković Golić, Danijela and Savić, Slavica M. and Radović, DV and Radulović, K and Vujatović, Stevan S and Lukic, L and Djuric, S and Nikolić, Maria Vesna and Bojicic, Aleksandar",
year = "2005",
abstract = "Thermal and electron transport properties of single crystal NiO were determined using the photoacoustic technique. NiO single crystals were prepared using the Verneuil method and were easily cleaved parallel to the (100) plane. All samples were of the p type. Atomic force microscopy images of cleaved NiO samples were made enabling a view of steps along the (001) direction and terraces, which were between 20 nm and 100 nm thick.",
publisher = "E D P Sciences, Les Ulis Cedex A",
journal = "Journal De Physique IV",
title = "Photoacoustic determination of thermal and electron transport properties of single crystal NiO",
pages = "442-439",
volume = "125",
doi = "10.1051/jp4:20051250103"
}
Nikolić, P. M., Luković Golić, D., Savić, S. M., Radović, D., Radulović, K., Vujatović, S. S., Lukic, L., Djuric, S., Nikolić, M. V.,& Bojicic, A.. (2005). Photoacoustic determination of thermal and electron transport properties of single crystal NiO. in Journal De Physique IV
E D P Sciences, Les Ulis Cedex A., 125, 439-442.
https://doi.org/10.1051/jp4:20051250103
Nikolić PM, Luković Golić D, Savić SM, Radović D, Radulović K, Vujatović SS, Lukic L, Djuric S, Nikolić MV, Bojicic A. Photoacoustic determination of thermal and electron transport properties of single crystal NiO. in Journal De Physique IV. 2005;125:439-442.
doi:10.1051/jp4:20051250103 .
Nikolić, Pantelija M., Luković Golić, Danijela, Savić, Slavica M., Radović, DV, Radulović, K, Vujatović, Stevan S, Lukic, L, Djuric, S, Nikolić, Maria Vesna, Bojicic, Aleksandar, "Photoacoustic determination of thermal and electron transport properties of single crystal NiO" in Journal De Physique IV, 125 (2005):439-442,
https://doi.org/10.1051/jp4:20051250103 . .

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