Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering
Samo za registrovane korisnike
2008
Autori
Nikolić, Maria VesnaSatoh, K.
Ivetić, Tamara B.
Paraskevopoulos, K.M.
Zorba, T.T.
Blagojević, V.
Mančić, Lidija T
Nikolić, Pantelija M.
Članak u časopisu (Objavljena verzija)
Metapodaci
Prikaz svih podataka o dokumentuApstrakt
Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm(-1). The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Bom effective charges were calculated from the transversal/ longitudinal splitting.
Ključne reči:
zinc-stannate / X-ray diffraction / sputtering / Rietveld analysis / optical properties / Fourier transform infrared spectroscopyIzvor:
Thin Solid Films, 2008, 516, 18, 6293-6299Izdavač:
- Elsevier Science Sa, Lausanne
DOI: 10.1016/j.tsf.2007.12.118
ISSN: 0040-6090
WoS: 000258037300057
Scopus: 2-s2.0-44649101331
Institucija/grupa
Institut za multidisciplinarna istraživanjaTY - JOUR AU - Nikolić, Maria Vesna AU - Satoh, K. AU - Ivetić, Tamara B. AU - Paraskevopoulos, K.M. AU - Zorba, T.T. AU - Blagojević, V. AU - Mančić, Lidija T AU - Nikolić, Pantelija M. PY - 2008 UR - http://rimsi.imsi.bg.ac.rs/handle/123456789/251 AB - Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm(-1). The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Bom effective charges were calculated from the transversal/ longitudinal splitting. PB - Elsevier Science Sa, Lausanne T2 - Thin Solid Films T1 - Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering EP - 6299 IS - 18 SP - 6293 VL - 516 DO - 10.1016/j.tsf.2007.12.118 ER -
@article{ author = "Nikolić, Maria Vesna and Satoh, K. and Ivetić, Tamara B. and Paraskevopoulos, K.M. and Zorba, T.T. and Blagojević, V. and Mančić, Lidija T and Nikolić, Pantelija M.", year = "2008", abstract = "Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm(-1). The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Bom effective charges were calculated from the transversal/ longitudinal splitting.", publisher = "Elsevier Science Sa, Lausanne", journal = "Thin Solid Films", title = "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering", pages = "6299-6293", number = "18", volume = "516", doi = "10.1016/j.tsf.2007.12.118" }
Nikolić, M. V., Satoh, K., Ivetić, T. B., Paraskevopoulos, K.M., Zorba, T.T., Blagojević, V., Mančić, L. T.,& Nikolić, P. M.. (2008). Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering. in Thin Solid Films Elsevier Science Sa, Lausanne., 516(18), 6293-6299. https://doi.org/10.1016/j.tsf.2007.12.118
Nikolić MV, Satoh K, Ivetić TB, Paraskevopoulos K, Zorba T, Blagojević V, Mančić LT, Nikolić PM. Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering. in Thin Solid Films. 2008;516(18):6293-6299. doi:10.1016/j.tsf.2007.12.118 .
Nikolić, Maria Vesna, Satoh, K., Ivetić, Tamara B., Paraskevopoulos, K.M., Zorba, T.T., Blagojević, V., Mančić, Lidija T, Nikolić, Pantelija M., "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering" in Thin Solid Films, 516, no. 18 (2008):6293-6299, https://doi.org/10.1016/j.tsf.2007.12.118 . .