Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture
Апстракт
In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for different measurement types. Because of that, we have developed new adaptation microstrip test fixture on printed circuit board for vector network analyzers' measurements of surface mount devices with three terminals. Two commercially available components, multilayer T-type LC filters, are measured and characterized using a vector network analyzer. The comparison of measurement data and simulation values of electrical equivalent circuit and electromagnetic model for two LC filters is further presented. The new improved model of T-type LC filters has provided better agreement between measurement and simulation.
Кључне речи:
test fixture / scattering parameters / modeling / LC filters / Electromagnetic interference (EMI)Извор:
IEEE Transactions on Magnetics, 2011, 47, 10, 3975-3978Издавач:
- IEEE-Inst Electrical Electronics Engineers Inc, Piscataway
DOI: 10.1109/TMAG.2011.2150738
ISSN: 0018-9464
WoS: 000296418200426
Scopus: 2-s2.0-80053556105
Институција/група
Institut za multidisciplinarna istraživanjaTY - JOUR AU - Menićanin, Aleksandar AU - Damnjanović, Mirjana S AU - Živanov, Ljiljana D AU - Aleksić, Obrad PY - 2011 UR - http://rimsi.imsi.bg.ac.rs/handle/123456789/493 AB - In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for different measurement types. Because of that, we have developed new adaptation microstrip test fixture on printed circuit board for vector network analyzers' measurements of surface mount devices with three terminals. Two commercially available components, multilayer T-type LC filters, are measured and characterized using a vector network analyzer. The comparison of measurement data and simulation values of electrical equivalent circuit and electromagnetic model for two LC filters is further presented. The new improved model of T-type LC filters has provided better agreement between measurement and simulation. PB - IEEE-Inst Electrical Electronics Engineers Inc, Piscataway T2 - IEEE Transactions on Magnetics T1 - Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture EP - 3978 IS - 10 SP - 3975 VL - 47 DO - 10.1109/TMAG.2011.2150738 ER -
@article{ author = "Menićanin, Aleksandar and Damnjanović, Mirjana S and Živanov, Ljiljana D and Aleksić, Obrad", year = "2011", abstract = "In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for different measurement types. Because of that, we have developed new adaptation microstrip test fixture on printed circuit board for vector network analyzers' measurements of surface mount devices with three terminals. Two commercially available components, multilayer T-type LC filters, are measured and characterized using a vector network analyzer. The comparison of measurement data and simulation values of electrical equivalent circuit and electromagnetic model for two LC filters is further presented. The new improved model of T-type LC filters has provided better agreement between measurement and simulation.", publisher = "IEEE-Inst Electrical Electronics Engineers Inc, Piscataway", journal = "IEEE Transactions on Magnetics", title = "Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture", pages = "3978-3975", number = "10", volume = "47", doi = "10.1109/TMAG.2011.2150738" }
Menićanin, A., Damnjanović, M. S., Živanov, L. D.,& Aleksić, O.. (2011). Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture. in IEEE Transactions on Magnetics IEEE-Inst Electrical Electronics Engineers Inc, Piscataway., 47(10), 3975-3978. https://doi.org/10.1109/TMAG.2011.2150738
Menićanin A, Damnjanović MS, Živanov LD, Aleksić O. Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture. in IEEE Transactions on Magnetics. 2011;47(10):3975-3978. doi:10.1109/TMAG.2011.2150738 .
Menićanin, Aleksandar, Damnjanović, Mirjana S, Živanov, Ljiljana D, Aleksić, Obrad, "Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture" in IEEE Transactions on Magnetics, 47, no. 10 (2011):3975-3978, https://doi.org/10.1109/TMAG.2011.2150738 . .