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Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture

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Authors
Menićanin, Aleksandar
Damnjanović, Mirjana S
Živanov, Ljiljana D
Aleksić, Obrad
Article (Published version)
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Abstract
In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for different measurement types. Because of that, we have developed new adaptation microstrip test fixture on printed circuit board for vector network analyzers' measurements of surface mount devices with three terminals. Two commercially available components, multilayer T-type LC filters, are measured and characterized using a vector network analyzer. The comparison of measurement data and simulation values of electrical equivalent circuit and electromagnetic model for two LC filters is further presented. The new improved model of T-type LC filters has provided better agreement between measurement and simulation.
Keywords:
test fixture / scattering parameters / modeling / LC filters / Electromagnetic interference (EMI)
Source:
IEEE Transactions on Magnetics, 2011, 47, 10, 3975-3978
Publisher:
  • IEEE-Inst Electrical Electronics Engineers Inc, Piscataway

DOI: 10.1109/TMAG.2011.2150738

ISSN: 0018-9464

WoS: 000296418200426

Scopus: 2-s2.0-80053556105
[ Google Scholar ]
6
3
URI
http://rimsi.imsi.bg.ac.rs/handle/123456789/493
Collections
  • Radovi istraživača / Researchers’ publications
Institution/Community
Institut za multidisciplinarna istraživanja
TY  - JOUR
AU  - Menićanin, Aleksandar
AU  - Damnjanović, Mirjana S
AU  - Živanov, Ljiljana D
AU  - Aleksić, Obrad
PY  - 2011
UR  - http://rimsi.imsi.bg.ac.rs/handle/123456789/493
AB  - In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for different measurement types. Because of that, we have developed new adaptation microstrip test fixture on printed circuit board for vector network analyzers' measurements of surface mount devices with three terminals. Two commercially available components, multilayer T-type LC filters, are measured and characterized using a vector network analyzer. The comparison of measurement data and simulation values of electrical equivalent circuit and electromagnetic model for two LC filters is further presented. The new improved model of T-type LC filters has provided better agreement between measurement and simulation.
PB  - IEEE-Inst Electrical Electronics Engineers Inc, Piscataway
T2  - IEEE Transactions on Magnetics
T1  - Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture
EP  - 3978
IS  - 10
SP  - 3975
VL  - 47
DO  - 10.1109/TMAG.2011.2150738
ER  - 
@article{
author = "Menićanin, Aleksandar and Damnjanović, Mirjana S and Živanov, Ljiljana D and Aleksić, Obrad",
year = "2011",
abstract = "In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for different measurement types. Because of that, we have developed new adaptation microstrip test fixture on printed circuit board for vector network analyzers' measurements of surface mount devices with three terminals. Two commercially available components, multilayer T-type LC filters, are measured and characterized using a vector network analyzer. The comparison of measurement data and simulation values of electrical equivalent circuit and electromagnetic model for two LC filters is further presented. The new improved model of T-type LC filters has provided better agreement between measurement and simulation.",
publisher = "IEEE-Inst Electrical Electronics Engineers Inc, Piscataway",
journal = "IEEE Transactions on Magnetics",
title = "Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture",
pages = "3978-3975",
number = "10",
volume = "47",
doi = "10.1109/TMAG.2011.2150738"
}
Menićanin, A., Damnjanović, M. S., Živanov, L. D.,& Aleksić, O.. (2011). Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture. in IEEE Transactions on Magnetics
IEEE-Inst Electrical Electronics Engineers Inc, Piscataway., 47(10), 3975-3978.
https://doi.org/10.1109/TMAG.2011.2150738
Menićanin A, Damnjanović MS, Živanov LD, Aleksić O. Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture. in IEEE Transactions on Magnetics. 2011;47(10):3975-3978.
doi:10.1109/TMAG.2011.2150738 .
Menićanin, Aleksandar, Damnjanović, Mirjana S, Živanov, Ljiljana D, Aleksić, Obrad, "Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture" in IEEE Transactions on Magnetics, 47, no. 10 (2011):3975-3978,
https://doi.org/10.1109/TMAG.2011.2150738 . .

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