The in-plane penetration depth of Sr0.88La0.12CuO2+x thin films at various doping obtained from oxygen reduction has been measured, using ac-susceptibility measurements. For the higher doping samples, the superfluid density deviates strongly from the s-wave behavior, suggesting, in analogy with other electron-doped cuprates, a contribution from a nodal hole pocket, or a small gap on the Fermi surface such as an anisotropic s-wave order parameter. The low value of the superfluid densities, likely due to a strong doping-induced disorder, places the superconducting transition of our samples in the phase-fluctuation regime.
Keywords:
superconductors / electron-doped cuprate / epitaxial thin films / penetration depth / superfluid density
Source:
Physical Review B, 2010, 82, 14
Publisher:
Amer Physical Soc, College Pk
Funding / projects:
ANRFrench National Research Agency (ANR) [ANR-07-BLAN-0242-CSD 4]
TY - JOUR
AU - Fruchter, L
AU - Jovanović, Vladimir
AU - Raffy, H
AU - Labdi, Sid
AU - Bouquet, F
AU - Li, ZZ
PY - 2010
UR - http://rimsi.imsi.bg.ac.rs/handle/123456789/432
AB - The in-plane penetration depth of Sr0.88La0.12CuO2+x thin films at various doping obtained from oxygen reduction has been measured, using ac-susceptibility measurements. For the higher doping samples, the superfluid density deviates strongly from the s-wave behavior, suggesting, in analogy with other electron-doped cuprates, a contribution from a nodal hole pocket, or a small gap on the Fermi surface such as an anisotropic s-wave order parameter. The low value of the superfluid densities, likely due to a strong doping-induced disorder, places the superconducting transition of our samples in the phase-fluctuation regime.
PB - Amer Physical Soc, College Pk
T2 - Physical Review B
T1 - Penetration depth of electron-doped infinite-layer Sr0.88La0.12CuO2+x thin films
IS - 14
VL - 82
DO - 10.1103/PhysRevB.82.144529
ER -
@article{
author = "Fruchter, L and Jovanović, Vladimir and Raffy, H and Labdi, Sid and Bouquet, F and Li, ZZ",
year = "2010",
abstract = "The in-plane penetration depth of Sr0.88La0.12CuO2+x thin films at various doping obtained from oxygen reduction has been measured, using ac-susceptibility measurements. For the higher doping samples, the superfluid density deviates strongly from the s-wave behavior, suggesting, in analogy with other electron-doped cuprates, a contribution from a nodal hole pocket, or a small gap on the Fermi surface such as an anisotropic s-wave order parameter. The low value of the superfluid densities, likely due to a strong doping-induced disorder, places the superconducting transition of our samples in the phase-fluctuation regime.",
publisher = "Amer Physical Soc, College Pk",
journal = "Physical Review B",
title = "Penetration depth of electron-doped infinite-layer Sr0.88La0.12CuO2+x thin films",
number = "14",
volume = "82",
doi = "10.1103/PhysRevB.82.144529"
}
Fruchter, L., Jovanović, V., Raffy, H., Labdi, S., Bouquet, F.,& Li, Z.. (2010). Penetration depth of electron-doped infinite-layer Sr0.88La0.12CuO2+x thin films. in Physical Review B
Amer Physical Soc, College Pk., 82(14).
https://doi.org/10.1103/PhysRevB.82.144529
Fruchter L, Jovanović V, Raffy H, Labdi S, Bouquet F, Li Z. Penetration depth of electron-doped infinite-layer Sr0.88La0.12CuO2+x thin films. in Physical Review B. 2010;82(14).
doi:10.1103/PhysRevB.82.144529 .
