An innovative in-situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline
Authors
Hafner, AljošaCosta, Luca
Kourousias, George
Bonanni, Valentina
Žižić, Milan
Stolfa, Andrea
Bazi, Benjamin
Vincze, Laszlo
Gianoncelli, Alessandra
Article (Published version)
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Show full item recordAbstract
Multimodal imaging and spectroscopy like concurrent Scanning
Transmission X-ray Microscopy (STXM) and X-ray Fluorescence
(XRF) are highly desirable as they allow retrieving complementary
information. This paper reports on the design, development,
integration and field testing of a novel in-situ Atomic Force
Microscopy (AFM) instrument for operation in high vacuum in a
synchrotron soft X-ray microscopy STXM-XRF end-station. A
combination of XRF-AFM is demonstrated for the first time in the
soft X-ray regime, with an outlook for the full XRF-STXM-AFM combination.
Keywords:
Atomic Force Microscope / micro x ray florescence microscopy / scanning transmition x ray microscopy / synchrotronSource:
Analyst, 2024, 149, 3, 700-706Publisher:
- Royal Society of Chemistry
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Institut za multidisciplinarna istraživanjaTY - JOUR AU - Hafner, Aljoša AU - Costa, Luca AU - Kourousias, George AU - Bonanni, Valentina AU - Žižić, Milan AU - Stolfa, Andrea AU - Bazi, Benjamin AU - Vincze, Laszlo AU - Gianoncelli, Alessandra PY - 2024 UR - http://rimsi.imsi.bg.ac.rs/handle/123456789/3179 AB - Multimodal imaging and spectroscopy like concurrent Scanning Transmission X-ray Microscopy (STXM) and X-ray Fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel in-situ Atomic Force Microscopy (AFM) instrument for operation in high vacuum in a synchrotron soft X-ray microscopy STXM-XRF end-station. A combination of XRF-AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF-STXM-AFM combination. PB - Royal Society of Chemistry T2 - Analyst T1 - An innovative in-situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline EP - 706 IS - 3 SP - 700 VL - 149 DO - 10.1039/D3AN01358H ER -
@article{ author = "Hafner, Aljoša and Costa, Luca and Kourousias, George and Bonanni, Valentina and Žižić, Milan and Stolfa, Andrea and Bazi, Benjamin and Vincze, Laszlo and Gianoncelli, Alessandra", year = "2024", abstract = "Multimodal imaging and spectroscopy like concurrent Scanning Transmission X-ray Microscopy (STXM) and X-ray Fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel in-situ Atomic Force Microscopy (AFM) instrument for operation in high vacuum in a synchrotron soft X-ray microscopy STXM-XRF end-station. A combination of XRF-AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF-STXM-AFM combination.", publisher = "Royal Society of Chemistry", journal = "Analyst", title = "An innovative in-situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline", pages = "706-700", number = "3", volume = "149", doi = "10.1039/D3AN01358H" }
Hafner, A., Costa, L., Kourousias, G., Bonanni, V., Žižić, M., Stolfa, A., Bazi, B., Vincze, L.,& Gianoncelli, A.. (2024). An innovative in-situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline. in Analyst Royal Society of Chemistry., 149(3), 700-706. https://doi.org/10.1039/D3AN01358H
Hafner A, Costa L, Kourousias G, Bonanni V, Žižić M, Stolfa A, Bazi B, Vincze L, Gianoncelli A. An innovative in-situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline. in Analyst. 2024;149(3):700-706. doi:10.1039/D3AN01358H .
Hafner, Aljoša, Costa, Luca, Kourousias, George, Bonanni, Valentina, Žižić, Milan, Stolfa, Andrea, Bazi, Benjamin, Vincze, Laszlo, Gianoncelli, Alessandra, "An innovative in-situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline" in Analyst, 149, no. 3 (2024):700-706, https://doi.org/10.1039/D3AN01358H . .