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EM Simulator Analysis of Optimal Performance Thick-Film Segmented Thermistors versus Material Characteristics Selection
dc.creator | Maric, Viktor | |
dc.creator | Luković, Miloljub | |
dc.creator | Živanov, Ljiljana D | |
dc.creator | Aleksić, Obrad | |
dc.creator | Menicanin, Aleksandar | |
dc.date.accessioned | 2022-04-05T14:17:06Z | |
dc.date.available | 2022-04-05T14:17:06Z | |
dc.date.issued | 2008 | |
dc.identifier.issn | 0018-9456 | |
dc.identifier.uri | http://rimsi.imsi.bg.ac.rs/handle/123456789/280 | |
dc.description.abstract | In this paper, an alternative approach to the analysis of thick-film segmented negative temperature coefficient thermistors based on the use of a commercial electromagnetic simulator tool is presented. The influence of the geometrical parameters and material characteristics of the used thermistor paste on the overall thermistor performance was analyzed and simulated. A physical model for the segmented thermistors is given in brief, together with experimental data. The diffusion of electrode metal into the thermistor layer was analyzed, simulated, and estimated. Obtained simulation results were compared with experimental results, and the validity of the adopted approach was verified. | en |
dc.publisher | IEEE-Inst Electrical Electronics Engineers Inc, Piscataway | |
dc.rights | restrictedAccess | |
dc.source | IEEE Transactions on Instrumentation and Measurement | |
dc.subject | thick film | en |
dc.subject | thermistor | en |
dc.subject | negative temperature coefficient (NTC) | en |
dc.subject | layer thickness | en |
dc.subject | electromagnetic (EM) simulator | en |
dc.subject | diffusion | en |
dc.subject | dielectric permittivity | en |
dc.subject | Bulk conductivity | en |
dc.title | EM Simulator Analysis of Optimal Performance Thick-Film Segmented Thermistors versus Material Characteristics Selection | en |
dc.type | article | |
dc.rights.license | ARR | |
dc.citation.epage | 2575 | |
dc.citation.issue | 11 | |
dc.citation.other | 57(11): 2568-2575 | |
dc.citation.rank | M22 | |
dc.citation.spage | 2568 | |
dc.citation.volume | 57 | |
dc.identifier.doi | 10.1109/TIM.2008.925017 | |
dc.identifier.scopus | 2-s2.0-54949093563 | |
dc.identifier.wos | 000260463500024 | |
dc.type.version | publishedVersion |
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