Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm(-1). The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Bom effective charges were calculated from the transversal/ longitudinal splitting.
TY - JOUR
AU - Nikolić, Maria Vesna
AU - Satoh, K.
AU - Ivetić, Tamara B.
AU - Paraskevopoulos, K.M.
AU - Zorba, T.T.
AU - Blagojević, V.
AU - Mančić, Lidija T
AU - Nikolić, Pantelija M.
PY - 2008
UR - http://rimsi.imsi.bg.ac.rs/handle/123456789/251
AB - Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm(-1). The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Bom effective charges were calculated from the transversal/ longitudinal splitting.
PB - Elsevier Science Sa, Lausanne
T2 - Thin Solid Films
T1 - Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering
EP - 6299
IS - 18
SP - 6293
VL - 516
DO - 10.1016/j.tsf.2007.12.118
ER -
@article{
author = "Nikolić, Maria Vesna and Satoh, K. and Ivetić, Tamara B. and Paraskevopoulos, K.M. and Zorba, T.T. and Blagojević, V. and Mančić, Lidija T and Nikolić, Pantelija M.",
year = "2008",
abstract = "Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm(-1). The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Bom effective charges were calculated from the transversal/ longitudinal splitting.",
publisher = "Elsevier Science Sa, Lausanne",
journal = "Thin Solid Films",
title = "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering",
pages = "6299-6293",
number = "18",
volume = "516",
doi = "10.1016/j.tsf.2007.12.118"
}
Nikolić, M. V., Satoh, K., Ivetić, T. B., Paraskevopoulos, K.M., Zorba, T.T., Blagojević, V., Mančić, L. T.,& Nikolić, P. M.. (2008). Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering. in Thin Solid Films
Elsevier Science Sa, Lausanne., 516(18), 6293-6299.
https://doi.org/10.1016/j.tsf.2007.12.118
Nikolić MV, Satoh K, Ivetić TB, Paraskevopoulos K, Zorba T, Blagojević V, Mančić LT, Nikolić PM. Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering. in Thin Solid Films. 2008;516(18):6293-6299.
doi:10.1016/j.tsf.2007.12.118 .
Nikolić, Maria Vesna, Satoh, K., Ivetić, Tamara B., Paraskevopoulos, K.M., Zorba, T.T., Blagojević, V., Mančić, Lidija T, Nikolić, Pantelija M., "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering" in Thin Solid Films, 516, no. 18 (2008):6293-6299,
https://doi.org/10.1016/j.tsf.2007.12.118 . .
