Room temperature far infrared reflectivity spectra of single phase spinel zinc-stannate thin films, prepared by rf magnetron sputtering on a glass substrate, and bulk sintered samples were measured. The sintered samples were obtained by mechanical activation of starting ZnO and SnO2 powders for 10 min followed by sintering at 1300 degrees C for 2 h. The reflectivity diagrams obtained for bulk samples were numerically analyzed using the four-parameter model of coupled oscillators. The optical parameters were determined for six observed ionic oscillators belonging to the spinel structure and two additional oscillators originating from the sintering procedure resulting from pores and grain boundaries. The reflectivity diagrams obtained for thin film samples were analyzed using the four-parameter model for optical phonons with a standard optical multi-layer technique.
Keywords:
zinc-stannate / thin films / optical properties / infrared spectroscopy
Source:
Materials Science and Engineering B-Solid State Materials for Advanced Technology, 2007, 138, 1, 7-11
TY - JOUR
AU - Nikolić, Maria Vesna
AU - Ivetić, Tamara B.
AU - Young, D. L.
AU - Paraskevopoulos, K.M.
AU - Zorba, T.T.
AU - Blagojević, V.
AU - Nikolić, Pantelija M.
AU - Vasiljević-Radović, Dana
AU - Ristic, M. M.
PY - 2007
UR - http://rimsi.imsi.bg.ac.rs/handle/123456789/181
AB - Room temperature far infrared reflectivity spectra of single phase spinel zinc-stannate thin films, prepared by rf magnetron sputtering on a glass substrate, and bulk sintered samples were measured. The sintered samples were obtained by mechanical activation of starting ZnO and SnO2 powders for 10 min followed by sintering at 1300 degrees C for 2 h. The reflectivity diagrams obtained for bulk samples were numerically analyzed using the four-parameter model of coupled oscillators. The optical parameters were determined for six observed ionic oscillators belonging to the spinel structure and two additional oscillators originating from the sintering procedure resulting from pores and grain boundaries. The reflectivity diagrams obtained for thin film samples were analyzed using the four-parameter model for optical phonons with a standard optical multi-layer technique.
PB - Elsevier Science Sa, Lausanne
T2 - Materials Science and Engineering B-Solid State Materials for Advanced Technology
T1 - Far infrared properties of bulk sintered and thin film Zn2SnO4
EP - 11
IS - 1
SP - 7
VL - 138
DO - 10.1016/j.mseb.2006.12.005
ER -
@article{
author = "Nikolić, Maria Vesna and Ivetić, Tamara B. and Young, D. L. and Paraskevopoulos, K.M. and Zorba, T.T. and Blagojević, V. and Nikolić, Pantelija M. and Vasiljević-Radović, Dana and Ristic, M. M.",
year = "2007",
abstract = "Room temperature far infrared reflectivity spectra of single phase spinel zinc-stannate thin films, prepared by rf magnetron sputtering on a glass substrate, and bulk sintered samples were measured. The sintered samples were obtained by mechanical activation of starting ZnO and SnO2 powders for 10 min followed by sintering at 1300 degrees C for 2 h. The reflectivity diagrams obtained for bulk samples were numerically analyzed using the four-parameter model of coupled oscillators. The optical parameters were determined for six observed ionic oscillators belonging to the spinel structure and two additional oscillators originating from the sintering procedure resulting from pores and grain boundaries. The reflectivity diagrams obtained for thin film samples were analyzed using the four-parameter model for optical phonons with a standard optical multi-layer technique.",
publisher = "Elsevier Science Sa, Lausanne",
journal = "Materials Science and Engineering B-Solid State Materials for Advanced Technology",
title = "Far infrared properties of bulk sintered and thin film Zn2SnO4",
pages = "11-7",
number = "1",
volume = "138",
doi = "10.1016/j.mseb.2006.12.005"
}
Nikolić, M. V., Ivetić, T. B., Young, D. L., Paraskevopoulos, K.M., Zorba, T.T., Blagojević, V., Nikolić, P. M., Vasiljević-Radović, D.,& Ristic, M. M.. (2007). Far infrared properties of bulk sintered and thin film Zn2SnO4. in Materials Science and Engineering B-Solid State Materials for Advanced Technology
Elsevier Science Sa, Lausanne., 138(1), 7-11.
https://doi.org/10.1016/j.mseb.2006.12.005
Nikolić MV, Ivetić TB, Young DL, Paraskevopoulos K, Zorba T, Blagojević V, Nikolić PM, Vasiljević-Radović D, Ristic MM. Far infrared properties of bulk sintered and thin film Zn2SnO4. in Materials Science and Engineering B-Solid State Materials for Advanced Technology. 2007;138(1):7-11.
doi:10.1016/j.mseb.2006.12.005 .
Nikolić, Maria Vesna, Ivetić, Tamara B., Young, D. L., Paraskevopoulos, K.M., Zorba, T.T., Blagojević, V., Nikolić, Pantelija M., Vasiljević-Radović, Dana, Ristic, M. M., "Far infrared properties of bulk sintered and thin film Zn2SnO4" in Materials Science and Engineering B-Solid State Materials for Advanced Technology, 138, no. 1 (2007):7-11,
https://doi.org/10.1016/j.mseb.2006.12.005 . .
