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dc.creatorNikolić, Pantelija M.
dc.creatorLuković Golić, Danijela
dc.creatorSavić, Slavica M.
dc.creatorRadović, DV
dc.creatorRadulović, K
dc.creatorVujatović, Stevan S
dc.creatorLukic, L
dc.creatorDjuric, S
dc.creatorNikolić, Maria Vesna
dc.creatorBojicic, Aleksandar
dc.date.accessioned2022-04-05T14:06:33Z
dc.date.available2022-04-05T14:06:33Z
dc.date.issued2005
dc.identifier.issn1155-4339
dc.identifier.urihttp://rimsi.imsi.bg.ac.rs/handle/123456789/127
dc.description.abstractThermal and electron transport properties of single crystal NiO were determined using the photoacoustic technique. NiO single crystals were prepared using the Verneuil method and were easily cleaved parallel to the (100) plane. All samples were of the p type. Atomic force microscopy images of cleaved NiO samples were made enabling a view of steps along the (001) direction and terraces, which were between 20 nm and 100 nm thick.en
dc.publisherE D P Sciences, Les Ulis Cedex A
dc.rightsrestrictedAccess
dc.sourceJournal De Physique IV
dc.subjectNiO
dc.subjectphotoacoustic spectroscopy
dc.subjecttransport properties
dc.titlePhotoacoustic determination of thermal and electron transport properties of single crystal NiOen
dc.typearticle
dc.rights.licenseARR
dc.citation.epage442
dc.citation.other125: 439-442
dc.citation.rankM23
dc.citation.spage439
dc.citation.volume125
dc.identifier.doi10.1051/jp4:20051250103
dc.identifier.scopus2-s2.0-33645059500
dc.identifier.wos000230014700104
dc.type.versionpublishedVersion


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