TY  - JOUR
AU  - Damnjanović, Mirjana S
AU  - Živanov, Ljiljana D
AU  - Stojanović, Goran M
AU  - Menicanin, Aleksandar
PY  - 2010
UR  - http://rimsi.imsi.bg.ac.rs/handle/123456789/406
AB  - This paper explores an influence of conductive layer geometry on electrical parameters of ferrite electromagnetic interference (EMI) suppressor, which consists of conductive layer in ferrite monolithic structure. Near ferrimagnetic resonant frequency, component has maximal impedance and efficiently suppresses noise. In order to achieve better suppression (i.e., larger impedance), conductive layers should be longer. Nevertheless, longer conductive lines introduce parasitic capacitance, which causes the maximal impedance frequency shift. Because of that, the frequency range where component can be used for efficient EMI suppression is shifted towards lower frequencies, and designing process should be very careful. In this paper, we present simulation of frequency dependent impedance for different geometry parameters of conductive layer. Results for the inductance and the maximal impedance frequency shift of the proposed EMI suppressors are presented in the range 1 MHz-3 GHz. Proposed EMI suppressors were experimentally tested using Agilent 4287A RF LCR meter. Comparison of simulated and measured values of impedance shows a good agreement.
PB  - IEEE-Inst Electrical Electronics Engineers Inc, Piscataway
T2  - IEEE Transactions on Magnetics
T1  - Influence of Conductive Layer Geometry on Maximal Impedance Frequency Shift of Zig-Zag Ferrite EMI Suppressor
EP  - 1306
IS  - 6
SP  - 1303
VL  - 46
DO  - 10.1109/TMAG.2010.2042571
ER  - 

@article{
author = "Damnjanović, Mirjana S and Živanov, Ljiljana D and Stojanović, Goran M and Menicanin, Aleksandar",
year = "2010",
abstract = "This paper explores an influence of conductive layer geometry on electrical parameters of ferrite electromagnetic interference (EMI) suppressor, which consists of conductive layer in ferrite monolithic structure. Near ferrimagnetic resonant frequency, component has maximal impedance and efficiently suppresses noise. In order to achieve better suppression (i.e., larger impedance), conductive layers should be longer. Nevertheless, longer conductive lines introduce parasitic capacitance, which causes the maximal impedance frequency shift. Because of that, the frequency range where component can be used for efficient EMI suppression is shifted towards lower frequencies, and designing process should be very careful. In this paper, we present simulation of frequency dependent impedance for different geometry parameters of conductive layer. Results for the inductance and the maximal impedance frequency shift of the proposed EMI suppressors are presented in the range 1 MHz-3 GHz. Proposed EMI suppressors were experimentally tested using Agilent 4287A RF LCR meter. Comparison of simulated and measured values of impedance shows a good agreement.",
publisher = "IEEE-Inst Electrical Electronics Engineers Inc, Piscataway",
journal = "IEEE Transactions on Magnetics",
title = "Influence of Conductive Layer Geometry on Maximal Impedance Frequency Shift of Zig-Zag Ferrite EMI Suppressor",
pages = "1306-1303",
number = "6",
volume = "46",
doi = "10.1109/TMAG.2010.2042571"
}

Damnjanović, M. S., Živanov, L. D., Stojanović, G. M.,& Menicanin, A.. (2010). Influence of Conductive Layer Geometry on Maximal Impedance Frequency Shift of Zig-Zag Ferrite EMI Suppressor. in IEEE Transactions on Magnetics
IEEE-Inst Electrical Electronics Engineers Inc, Piscataway., 46(6), 1303-1306.
https://doi.org/10.1109/TMAG.2010.2042571

Damnjanović MS, Živanov LD, Stojanović GM, Menicanin A. Influence of Conductive Layer Geometry on Maximal Impedance Frequency Shift of Zig-Zag Ferrite EMI Suppressor. in IEEE Transactions on Magnetics. 2010;46(6):1303-1306.
doi:10.1109/TMAG.2010.2042571 .

Damnjanović, Mirjana S, Živanov, Ljiljana D, Stojanović, Goran M, Menicanin, Aleksandar, "Influence of Conductive Layer Geometry on Maximal Impedance Frequency Shift of Zig-Zag Ferrite EMI Suppressor" in IEEE Transactions on Magnetics, 46, no. 6 (2010):1303-1306,
https://doi.org/10.1109/TMAG.2010.2042571 . .