TY  - JOUR
AU  - Počuča-Nešić, Milica
AU  - Branković, Zorica
AU  - Branković, Goran
AU  - Vasiljević-Radović, Dana
PY  - 2008
UR  - http://rimsi.imsi.bg.ac.rs/handle/123456789/263
AB  - LaNiO3 thin films were successfully prepared by a chemical method from citrate precursors. The LNO precursor solution was spin-coated onto Si (100) and Si (111) substrates. To obtain epitaxial or highly oriented films, the deposited layers were slowly heated in a gradient thermal field, with a heating rate of 1 degrees min(-1), and annealed at 700 degrees C. The influence of different substrate orientations on the thin film morphology was investigated using atomic force microscopy and X-ray diffraction analysis. Well-crystallized films with grains aligned along a certain direction were obtained on both substrates. Films deposited on both substrates were very smooth, but with a different grain size and shape depending on the crystal orientation. Films deposited on Si (100) grew in the (110) direction and had elongated grains, whereas those on Si (111) grew in the (211) direction and had a quasi-square grain shape.
PB  - Wiley, Hoboken
T2  - Journal of Microscopy
T1  - Influence of substrate orientation on the morphologyand orientation of LaNiO3 thin films
EP  - 588
IS  - 3
SP  - 585
VL  - 232
DO  - 10.1111/j.1365-2818.2008.02121.x
ER  - 

@article{
author = "Počuča-Nešić, Milica and Branković, Zorica and Branković, Goran and Vasiljević-Radović, Dana",
year = "2008",
abstract = "LaNiO3 thin films were successfully prepared by a chemical method from citrate precursors. The LNO precursor solution was spin-coated onto Si (100) and Si (111) substrates. To obtain epitaxial or highly oriented films, the deposited layers were slowly heated in a gradient thermal field, with a heating rate of 1 degrees min(-1), and annealed at 700 degrees C. The influence of different substrate orientations on the thin film morphology was investigated using atomic force microscopy and X-ray diffraction analysis. Well-crystallized films with grains aligned along a certain direction were obtained on both substrates. Films deposited on both substrates were very smooth, but with a different grain size and shape depending on the crystal orientation. Films deposited on Si (100) grew in the (110) direction and had elongated grains, whereas those on Si (111) grew in the (211) direction and had a quasi-square grain shape.",
publisher = "Wiley, Hoboken",
journal = "Journal of Microscopy",
title = "Influence of substrate orientation on the morphologyand orientation of LaNiO3 thin films",
pages = "588-585",
number = "3",
volume = "232",
doi = "10.1111/j.1365-2818.2008.02121.x"
}

Počuča-Nešić, M., Branković, Z., Branković, G.,& Vasiljević-Radović, D.. (2008). Influence of substrate orientation on the morphologyand orientation of LaNiO3 thin films. in Journal of Microscopy
Wiley, Hoboken., 232(3), 585-588.
https://doi.org/10.1111/j.1365-2818.2008.02121.x

Počuča-Nešić M, Branković Z, Branković G, Vasiljević-Radović D. Influence of substrate orientation on the morphologyand orientation of LaNiO3 thin films. in Journal of Microscopy. 2008;232(3):585-588.
doi:10.1111/j.1365-2818.2008.02121.x .

Počuča-Nešić, Milica, Branković, Zorica, Branković, Goran, Vasiljević-Radović, Dana, "Influence of substrate orientation on the morphologyand orientation of LaNiO3 thin films" in Journal of Microscopy, 232, no. 3 (2008):585-588,
https://doi.org/10.1111/j.1365-2818.2008.02121.x . .

TY  - JOUR
AU  - Branković, Zorica
AU  - Branković, Goran
AU  - Vojisavljević, Katarina
AU  - Počuča-Nešić, Milica
AU  - Srećković, Tatjana
AU  - Vasiljević-Radović, Dana
PY  - 2007
UR  - http://rimsi.imsi.bg.ac.rs/handle/123456789/214
AB  - The modified polymeric precursor method (Pechini method) was successfully used for the preparation of epitaxial and polycrystalline ferroelectric Pb(Zr0.52Ti0.48)O-3 (PZT) thin films. Films were deposited on LaNiO3 (LNO) - coated silicium (1 0 0) and platinum substrates (Pt (1 1 1)/Ti/SiO2/Si) by spin coating technique. LNO electrodes were also prepared by the Pechini method and treated under different thermal treatment conditions to obtain films with different structural and microstructural properties. Investigation of PZT microstructure was performed as a function of orientation and morphology of the bottom electrode, as well as of thermal treatment conditions. Grain size and morphology were analyzed by AIM, while the quality and orientation of PZT films were determined by GIXRD analysis. It has been found that the proposed thermal treatment on a hot plate, with slow heating rate and long annealing time, can result in the formation of epitaxial PZT films on Si and LNO-coated Si substrates.
PB  - Trans Tech Publications Ltd, Durnten-Zurich
T2  - Research Trends in Contemporary Materials Science
T1  - Microstructural properties of PZT thin films deposited on LaNiO3-coated substrates
EP  - +
SP  - 315
VL  - 555
DO  - 10.4028/www.scientific.net/MSF.555.315
ER  - 

@article{
author = "Branković, Zorica and Branković, Goran and Vojisavljević, Katarina and Počuča-Nešić, Milica and Srećković, Tatjana and Vasiljević-Radović, Dana",
year = "2007",
abstract = "The modified polymeric precursor method (Pechini method) was successfully used for the preparation of epitaxial and polycrystalline ferroelectric Pb(Zr0.52Ti0.48)O-3 (PZT) thin films. Films were deposited on LaNiO3 (LNO) - coated silicium (1 0 0) and platinum substrates (Pt (1 1 1)/Ti/SiO2/Si) by spin coating technique. LNO electrodes were also prepared by the Pechini method and treated under different thermal treatment conditions to obtain films with different structural and microstructural properties. Investigation of PZT microstructure was performed as a function of orientation and morphology of the bottom electrode, as well as of thermal treatment conditions. Grain size and morphology were analyzed by AIM, while the quality and orientation of PZT films were determined by GIXRD analysis. It has been found that the proposed thermal treatment on a hot plate, with slow heating rate and long annealing time, can result in the formation of epitaxial PZT films on Si and LNO-coated Si substrates.",
publisher = "Trans Tech Publications Ltd, Durnten-Zurich",
journal = "Research Trends in Contemporary Materials Science",
title = "Microstructural properties of PZT thin films deposited on LaNiO3-coated substrates",
pages = "+-315",
volume = "555",
doi = "10.4028/www.scientific.net/MSF.555.315"
}

Branković, Z., Branković, G., Vojisavljević, K., Počuča-Nešić, M., Srećković, T.,& Vasiljević-Radović, D.. (2007). Microstructural properties of PZT thin films deposited on LaNiO3-coated substrates. in Research Trends in Contemporary Materials Science
Trans Tech Publications Ltd, Durnten-Zurich., 555, 315-+.
https://doi.org/10.4028/www.scientific.net/MSF.555.315

Branković Z, Branković G, Vojisavljević K, Počuča-Nešić M, Srećković T, Vasiljević-Radović D. Microstructural properties of PZT thin films deposited on LaNiO3-coated substrates. in Research Trends in Contemporary Materials Science. 2007;555:315-+.
doi:10.4028/www.scientific.net/MSF.555.315 .

Branković, Zorica, Branković, Goran, Vojisavljević, Katarina, Počuča-Nešić, Milica, Srećković, Tatjana, Vasiljević-Radović, Dana, "Microstructural properties of PZT thin films deposited on LaNiO3-coated substrates" in Research Trends in Contemporary Materials Science, 555 (2007):315-+,
https://doi.org/10.4028/www.scientific.net/MSF.555.315 . .