@article{
author = "Nikolić, Maria Vesna and Satoh, K. and Ivetić, Tamara B. and Paraskevopoulos, K.M. and Zorba, T.T. and Blagojević, V. and Mančić, Lidija T and Nikolić, Pantelija M.",
year = "2008",
abstract = "Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm(-1). The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Bom effective charges were calculated from the transversal/ longitudinal splitting.",
publisher = "Elsevier Science Sa, Lausanne",
journal = "Thin Solid Films",
title = "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering",
pages = "6299-6293",
number = "18",
volume = "516",
doi = "10.1016/j.tsf.2007.12.118"
}