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dc.creatorIlić, Nikola
dc.creatorAmoresi, R.C.
dc.creatorZanetti, S.M.
dc.creatorSpasojevic, Vojislav
dc.creatorFerreira Teixeira, Guilhermina
dc.creatorBobić, Jelena
dc.creatorZAGHETE, MARIA
dc.creatorStojanović, Biljana
dc.date.accessioned2023-12-01T06:53:53Z
dc.date.available2023-12-01T06:53:53Z
dc.date.issued2017
dc.identifier.isbn978-86-6253-082-0
dc.identifier.urihttp://rimsi.imsi.bg.ac.rs/handle/123456789/2603
dc.description.abstractThin films of BiFeO3 and doped BiFeO3 were prepared by chemical solution deposition method. Because of low electrical resistivity of BiFeO3 which often prevents it to exhibit ferroelectric properties, several elements were used as dopants, partially replacing Bi3+ (Y3+, Sr2+) or Fe3+ (Ti4+, Zr4+) ions. Dopants may also reduce the size of the grains improving the magnetic properties. Pure BiFeO3 phase was formed for all compositions without preferred orientation. All films are around 300 nm thick, with relatively densely packed round grains of the size well below 100 nm as it is presented with micrographies in Fig. 1. Some of the dopants have lowered the size of the grains and increased electrical resistivity enough for ferroelectric hysteresis to be measured at fields above 100 kV/cmsr
dc.language.isoensr
dc.publisherFaculty of Technology, University of Novi Sad Bul. cara Lazara 1, 21000 Novi Sad, Serbiasr
dc.rightsopenAccesssr
dc.source12th Conference for young scientists in ceramics, October 18-21, 2017, Novi Sadsr
dc.subjectThin filmssr
dc.subjectBiFeO3sr
dc.subjectDopantssr
dc.subjectelectrical resistivitysr
dc.subjectferroelectric hysteresissr
dc.titleBiFeO3 THIN FILMS: INFLUENCE OF DOPING ON STRUCTURE AND PROPRETIESsr
dc.typeconferenceObjectsr
dc.rights.licenseARRsr
dc.identifier.fulltexthttp://rimsi.imsi.bg.ac.rs/bitstream/id/6695/bitstream_6695.pdf
dc.identifier.rcubhttps://hdl.handle.net/21.15107/rcub_rimsi_2603
dc.type.versionpublishedVersionsr


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