Panjan, Peter

Link to this page

Authority KeyName Variants
bc7c6e9c-9dac-426e-9f15-f6da55f919f3
  • Panjan, Peter (3)
Projects

Author's Bibliography

Optical and electrical properties of gallium doped indium tin oxide optimized for low deposition temperature applications

Campa, Andrej; Berginc, Marko; Vojisavljević, Katarina; Malic, Barbara; Panjan, Peter; Topic, Marko

(Elsevier Science Sa, Lausanne, 2017)

TY  - JOUR
AU  - Campa, Andrej
AU  - Berginc, Marko
AU  - Vojisavljević, Katarina
AU  - Malic, Barbara
AU  - Panjan, Peter
AU  - Topic, Marko
PY  - 2017
UR  - http://rimsi.imsi.bg.ac.rs/handle/123456789/1033
AB  - In optoelectronic and photovoltaic devices, transparent conductive oxides are important in establishing a good electrical contact while minimizing optical losses over a broad range of wavelengths (400-1200 nm). To date, research has focused on In2O3- SnO2 (ITO) films. In this paper, we report on a study of Ga-doped ITO (GITO) films, which in contrast to standard ITO 90/10 (i.e. In:Sn = 90:10) films contain less In. Initially, we describe the development of a multicomponent Ga-In-Sn oxide target with a Ga:In:Sn ratio of 4:64:32, which was used in a radio frequency sputtering system to deposit GITO thin films on glass substrates. Furthermore, we describe the microstructural/structural (scanning electron microscopy and X-ray diffraction spectroscopy), optical (wavelength dependent complex refractive indices) and electrical (resistivity, mobility, free carrier density) measurements used to optimize sputtering conditions and post-annealing processing. As well as achieving an optimized/improved GITO thin film deposited at high substrate and annealing temperatures, we obtained promising thin GITO films with excellent optical properties and with relatively low resistivity (1.7 m Omega cm) deposited and annealed at temperatures around 200 degrees C.
PB  - Elsevier Science Sa, Lausanne
T2  - Thin Solid Films
T1  - Optical and electrical properties of gallium doped indium tin oxide optimized for low deposition temperature applications
EP  - 57
SP  - 52
VL  - 621
DO  - 10.1016/j.tsf.2016.11.028
ER  - 
@article{
author = "Campa, Andrej and Berginc, Marko and Vojisavljević, Katarina and Malic, Barbara and Panjan, Peter and Topic, Marko",
year = "2017",
abstract = "In optoelectronic and photovoltaic devices, transparent conductive oxides are important in establishing a good electrical contact while minimizing optical losses over a broad range of wavelengths (400-1200 nm). To date, research has focused on In2O3- SnO2 (ITO) films. In this paper, we report on a study of Ga-doped ITO (GITO) films, which in contrast to standard ITO 90/10 (i.e. In:Sn = 90:10) films contain less In. Initially, we describe the development of a multicomponent Ga-In-Sn oxide target with a Ga:In:Sn ratio of 4:64:32, which was used in a radio frequency sputtering system to deposit GITO thin films on glass substrates. Furthermore, we describe the microstructural/structural (scanning electron microscopy and X-ray diffraction spectroscopy), optical (wavelength dependent complex refractive indices) and electrical (resistivity, mobility, free carrier density) measurements used to optimize sputtering conditions and post-annealing processing. As well as achieving an optimized/improved GITO thin film deposited at high substrate and annealing temperatures, we obtained promising thin GITO films with excellent optical properties and with relatively low resistivity (1.7 m Omega cm) deposited and annealed at temperatures around 200 degrees C.",
publisher = "Elsevier Science Sa, Lausanne",
journal = "Thin Solid Films",
title = "Optical and electrical properties of gallium doped indium tin oxide optimized for low deposition temperature applications",
pages = "57-52",
volume = "621",
doi = "10.1016/j.tsf.2016.11.028"
}
Campa, A., Berginc, M., Vojisavljević, K., Malic, B., Panjan, P.,& Topic, M.. (2017). Optical and electrical properties of gallium doped indium tin oxide optimized for low deposition temperature applications. in Thin Solid Films
Elsevier Science Sa, Lausanne., 621, 52-57.
https://doi.org/10.1016/j.tsf.2016.11.028
Campa A, Berginc M, Vojisavljević K, Malic B, Panjan P, Topic M. Optical and electrical properties of gallium doped indium tin oxide optimized for low deposition temperature applications. in Thin Solid Films. 2017;621:52-57.
doi:10.1016/j.tsf.2016.11.028 .
Campa, Andrej, Berginc, Marko, Vojisavljević, Katarina, Malic, Barbara, Panjan, Peter, Topic, Marko, "Optical and electrical properties of gallium doped indium tin oxide optimized for low deposition temperature applications" in Thin Solid Films, 621 (2017):52-57,
https://doi.org/10.1016/j.tsf.2016.11.028 . .
4
5

Relation between sputtering parameters and optical and electrical properties of Ga doped ITO transparent conductive oxide

Berginc, Marko; Campa, Andrej; Vojisavljević, Katarina; Malic, Barbara; Panjan, Peter; Topic, Marko

(Elsevier Science Bv, Amsterdam, 2015)

TY  - CONF
AU  - Berginc, Marko
AU  - Campa, Andrej
AU  - Vojisavljević, Katarina
AU  - Malic, Barbara
AU  - Panjan, Peter
AU  - Topic, Marko
PY  - 2015
UR  - http://rimsi.imsi.bg.ac.rs/handle/123456789/913
AB  - A ceramic target with Ga:In:Sn=4:64:32 metal ratio has been sintered and used for RF sputtering process to develop high quality Ga doped ITO (GITO) transparent conductive oxide layers, particularly for photovoltaic applications. The sputtering parameters (sputtering power, oxygen flow, and substrate temperature) have been varied first and optimized with respect to the resistivity measurements. The layers deposited under optimized conditions were then post-annealed at different temperatures (200 - 500 degrees C) either in the air or in nitrogen atmosphere in order to further improve the conductivity. The deposited 200 nm thick GITO layer has high electron mobility (50 cm(2)/Vs) at relatively low resistivity (0.90 m Omega cm) although the free electron concentration is kept low (1.4x10(20) cm(-3)) to prevent excessive free-carrier absorption. Thus, high transmission of the layer (similar to 80% at 400 - 1500 nm) is obtained.
PB  - Elsevier Science Bv, Amsterdam
C3  - Proceedings of the Emrs 2015 Spring Meeting - Symposium C on Advanced Inorganic Materials and Struct
T1  - Relation between sputtering parameters and optical and electrical properties of Ga doped ITO transparent conductive oxide
EP  - 189
SP  - 183
VL  - 84
DO  - 10.1016/j.egypro.2015.12.312
ER  - 
@conference{
author = "Berginc, Marko and Campa, Andrej and Vojisavljević, Katarina and Malic, Barbara and Panjan, Peter and Topic, Marko",
year = "2015",
abstract = "A ceramic target with Ga:In:Sn=4:64:32 metal ratio has been sintered and used for RF sputtering process to develop high quality Ga doped ITO (GITO) transparent conductive oxide layers, particularly for photovoltaic applications. The sputtering parameters (sputtering power, oxygen flow, and substrate temperature) have been varied first and optimized with respect to the resistivity measurements. The layers deposited under optimized conditions were then post-annealed at different temperatures (200 - 500 degrees C) either in the air or in nitrogen atmosphere in order to further improve the conductivity. The deposited 200 nm thick GITO layer has high electron mobility (50 cm(2)/Vs) at relatively low resistivity (0.90 m Omega cm) although the free electron concentration is kept low (1.4x10(20) cm(-3)) to prevent excessive free-carrier absorption. Thus, high transmission of the layer (similar to 80% at 400 - 1500 nm) is obtained.",
publisher = "Elsevier Science Bv, Amsterdam",
journal = "Proceedings of the Emrs 2015 Spring Meeting - Symposium C on Advanced Inorganic Materials and Struct",
title = "Relation between sputtering parameters and optical and electrical properties of Ga doped ITO transparent conductive oxide",
pages = "189-183",
volume = "84",
doi = "10.1016/j.egypro.2015.12.312"
}
Berginc, M., Campa, A., Vojisavljević, K., Malic, B., Panjan, P.,& Topic, M.. (2015). Relation between sputtering parameters and optical and electrical properties of Ga doped ITO transparent conductive oxide. in Proceedings of the Emrs 2015 Spring Meeting - Symposium C on Advanced Inorganic Materials and Struct
Elsevier Science Bv, Amsterdam., 84, 183-189.
https://doi.org/10.1016/j.egypro.2015.12.312
Berginc M, Campa A, Vojisavljević K, Malic B, Panjan P, Topic M. Relation between sputtering parameters and optical and electrical properties of Ga doped ITO transparent conductive oxide. in Proceedings of the Emrs 2015 Spring Meeting - Symposium C on Advanced Inorganic Materials and Struct. 2015;84:183-189.
doi:10.1016/j.egypro.2015.12.312 .
Berginc, Marko, Campa, Andrej, Vojisavljević, Katarina, Malic, Barbara, Panjan, Peter, Topic, Marko, "Relation between sputtering parameters and optical and electrical properties of Ga doped ITO transparent conductive oxide" in Proceedings of the Emrs 2015 Spring Meeting - Symposium C on Advanced Inorganic Materials and Struct, 84 (2015):183-189,
https://doi.org/10.1016/j.egypro.2015.12.312 . .
7
6

Surface modification of a-CN/TiAlN double layer coating on ASP 30 steel induced by femtosecond laser with 10(13)-10(14) W/cm(2) intensity in vacuum

Trtica, Milan S; Limpouch, J.; Gavrilov, P.; Gemini, L.; Panjan, Peter; Stasic, J.; Milovanović, D.; Branković, Goran

(Cambridge Univ Press, New York, 2015)

TY  - JOUR
AU  - Trtica, Milan S
AU  - Limpouch, J.
AU  - Gavrilov, P.
AU  - Gemini, L.
AU  - Panjan, Peter
AU  - Stasic, J.
AU  - Milovanović, D.
AU  - Branković, Goran
PY  - 2015
UR  - http://rimsi.imsi.bg.ac.rs/handle/123456789/877
AB  - A double layer a-CN/TiAlN coating deposited on ASP30 steel substrate was irradiated by femtosecond laser and surface modification effects were observed. Moderate laser intensities used were in the range of 10(14)-10(13) W/cm(2), while the total thickness of double layer coating was 4.8 mu m (a-CN = 0.6 and TiAlN = 4.2 mu m). Laser-induced changes of the surface showed dependence on laser intensity and number of accumulated pulses. Irradiations at the highest intensity resulted in preservation of one or both layers up to 10 pulses, while at lower intensity (10(13) W/cm(2)) a-CN layer is removed after several pulses and TiAlN is preserved up to 50 pulses. Evaluated damage threshold of the target was 0.49 J/cm(2). Lower laser intensity irradiation produced periodic surface structures (LIPSS) over the entire irradiated spot with periodicity of similar to 700 nm, almost in agreement with the laser wavelength used. Irradiations carried out at the highest laser intensity (10(14) W/cm(2)) and laser pulse count of 50 resulted in the creation of crater like damages with depth up to 20 mu m. Craters were conically shaped, implying intensive processes which took place at the surface. Generation of LIPSS as well as craters can be of great interest for contemporary technologies.
PB  - Cambridge Univ Press, New York
T2  - Laser and Particle Beams
T1  - Surface modification of a-CN/TiAlN double layer coating on ASP 30 steel induced by femtosecond laser with 10(13)-10(14) W/cm(2) intensity in vacuum
EP  - 559
IS  - 3
SP  - 551
VL  - 33
DO  - 10.1017/S0263034615000610
ER  - 
@article{
author = "Trtica, Milan S and Limpouch, J. and Gavrilov, P. and Gemini, L. and Panjan, Peter and Stasic, J. and Milovanović, D. and Branković, Goran",
year = "2015",
abstract = "A double layer a-CN/TiAlN coating deposited on ASP30 steel substrate was irradiated by femtosecond laser and surface modification effects were observed. Moderate laser intensities used were in the range of 10(14)-10(13) W/cm(2), while the total thickness of double layer coating was 4.8 mu m (a-CN = 0.6 and TiAlN = 4.2 mu m). Laser-induced changes of the surface showed dependence on laser intensity and number of accumulated pulses. Irradiations at the highest intensity resulted in preservation of one or both layers up to 10 pulses, while at lower intensity (10(13) W/cm(2)) a-CN layer is removed after several pulses and TiAlN is preserved up to 50 pulses. Evaluated damage threshold of the target was 0.49 J/cm(2). Lower laser intensity irradiation produced periodic surface structures (LIPSS) over the entire irradiated spot with periodicity of similar to 700 nm, almost in agreement with the laser wavelength used. Irradiations carried out at the highest laser intensity (10(14) W/cm(2)) and laser pulse count of 50 resulted in the creation of crater like damages with depth up to 20 mu m. Craters were conically shaped, implying intensive processes which took place at the surface. Generation of LIPSS as well as craters can be of great interest for contemporary technologies.",
publisher = "Cambridge Univ Press, New York",
journal = "Laser and Particle Beams",
title = "Surface modification of a-CN/TiAlN double layer coating on ASP 30 steel induced by femtosecond laser with 10(13)-10(14) W/cm(2) intensity in vacuum",
pages = "559-551",
number = "3",
volume = "33",
doi = "10.1017/S0263034615000610"
}
Trtica, M. S., Limpouch, J., Gavrilov, P., Gemini, L., Panjan, P., Stasic, J., Milovanović, D.,& Branković, G.. (2015). Surface modification of a-CN/TiAlN double layer coating on ASP 30 steel induced by femtosecond laser with 10(13)-10(14) W/cm(2) intensity in vacuum. in Laser and Particle Beams
Cambridge Univ Press, New York., 33(3), 551-559.
https://doi.org/10.1017/S0263034615000610
Trtica MS, Limpouch J, Gavrilov P, Gemini L, Panjan P, Stasic J, Milovanović D, Branković G. Surface modification of a-CN/TiAlN double layer coating on ASP 30 steel induced by femtosecond laser with 10(13)-10(14) W/cm(2) intensity in vacuum. in Laser and Particle Beams. 2015;33(3):551-559.
doi:10.1017/S0263034615000610 .
Trtica, Milan S, Limpouch, J., Gavrilov, P., Gemini, L., Panjan, Peter, Stasic, J., Milovanović, D., Branković, Goran, "Surface modification of a-CN/TiAlN double layer coating on ASP 30 steel induced by femtosecond laser with 10(13)-10(14) W/cm(2) intensity in vacuum" in Laser and Particle Beams, 33, no. 3 (2015):551-559,
https://doi.org/10.1017/S0263034615000610 . .
1
1